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English: Characterization bench (microscope, ellipsometer, contact and optical profilometer) at LAAS technological facility in Toulouse, France.
|Author||Guillaume Paumier (user:guillom)|
(Reusing this file)
Own work, attribution, share-alike: Multi-license with GFDL and Creative Commons CC-BY-SA-3.0
|This and other images at their locations on:||(Info)|
|This work was created by Guillaume Paumier.
|Camera manufacturer||NIKON CORPORATION|
|Camera model||NIKON D200|
|Orientation of image||1|
|Image resolution in width direction||300|
|Image resolution in height direction||300|
|Unit of X and Y resolution||2|
|Exposure time||10/100 sec (0.1)|
|F number||f / 3.8|
|ISO speed rating||400|
|Compressed bits per pixel||4|
|Lens focal length||24 mm|
|Date and time original image was generated||2007:10:13 13:11:57|
|Date and time image was made digital data||2007:10:13 13:11:57|
|Meaning of each component|
|Maximum lens aperture||3.8|
|Supported Flashpix version||0100|
|Color space information||1|
|Exif image width||3872|
|Exif image length||2592|