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|Description||This instrument performs atomic force microscopy (AFM) to measure surface characteristics and imaging for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, among a multitude of other samples. Pictured: Seth Darling, scientist in the Electronic & Magnetic Materials & Devices group. The Center for Nanoscale Materials (CNM)] at Argonne National Laboratory is a joint partnership between the U.S. Department of Energy (DOE) and the State of Illinois, as part of DOE?S Nanoscale Science Research Center program.|
|Date||26 September 2008, 14:20|
|Source||Scanning probe microscope (Veeco Multimode with NanoScope V Controller)|
|This file is licensed under the Creative Commons Attribution-Share Alike 2.0 Generic license.|
|This image, originally posted to Flickr, was reviewed on July 5, 2009 by the administrator or reviewer File Upload Bot (Magnus Manske), who confirmed that it was available on Flickr under the above license on that date.|
|Camera manufacturer||NIKON CORPORATION|
|Camera model||NIKON D300|
|Image resolution in width direction||240|
|Image resolution in height direction||240|
|Unit of X and Y resolution||2|
|Exposure time||1/60 sec (0.016666666666667)|
|F number||f / 5|
|ISO speed rating||800|
|Lens focal length||14 mm|
|Date and time original image was generated||2008:09:26 14:20:24|
|Date and time image was made digital data||2008:09:26 14:20:24|
|Maximum lens aperture||3|
|Digital zoom ratio||1|
|Focal length in 35 mm film||21 mm|
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